A new approach for 3D quantitative STEM using defocus corrected electron ptychography

Mostaed A, Liberti E, Huang C, Kirkland AI, Nellist P
1 August 2022
Journal article
Journal:
Microscopy and Microanalysis
Volume:
28
Issue:
S1
,
Oxford University Press
,
pp.
380 - 381
No abstract available
DOI
10.1017/s1431927622002252
ORA record